TY  - JOUR
T1  - Investigation of Trap States in AllnN/AIN/GaN Heterostructures by Frequency-Dependent Admittance Analysis
A1  - Arslan, E.
A1  - Butun, S.
A1  - Safak, Y.
A1  - Ozbay, E.
JA  - J of Electronic Materials
Y1  - 2010
VL  - 39
SP  - 2681
EP  - 2686
ER  -