TY  - JOUR
T1  - Analysis of Fe Nanoparticles Cast from Acetone Using XPS Measurements Under D.C. or Pulsed Voltage Bias
A1  - Suzer, S.
A1  - Baer, D.R.
A1  - Engelhard, M.H.
JA  - Surface and Interface Analysis
Y1  - 2010
VL  - 42
SP  - 859
EP  - 862
ER  -