Contact mode imaging in the atomic force microscope using higher order flexural mode combined with a new sensor
| Type of publication: | Article |
| Citation: | |
| Publication status: | Accepted |
| Journal: | Applied Physics Letters |
| Volume: | 68 |
| Year: | 1996 |
| Pages: | 1427-1429 |
| DOI: | 10.1063/1.116102 |
| Keywords: | |
| Authors | |
| Added by: | [] |
| Total mark: | 5 |
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