Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy
| Type of publication: | Article |
| Citation: | |
| Publication status: | Accepted |
| Journal: | Electronics Letters |
| Volume: | 37 |
| Year: | 2001 |
| Pages: | 1335-1336 |
| Keywords: | |
| Authors | |
| Added by: | [] |
| Total mark: | 5 |
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