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Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(100)(2x1) with small oscillation amplitudes
| Type of publication: | Article |
| Citation: | |
| Publication status: | Accepted |
| Journal: | Applied Surface Science |
| Volume: | 188 |
| Year: | 2002 |
| Pages: | 301-305 |
| Keywords: | |
| Authors | |
| Added by: | [] |
| Total mark: | 5 |
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