Simultaneous nc-AFM/STM Imaging and Force Spectroscopy of Si(001)-(2x1) Surface with small oscillation Amplitudes
Type of publication: | Article |
Citation: | |
Publication status: | Accepted |
Journal: | Applied Surface Science |
Volume: | 188 |
Year: | 2002 |
Pages: | 301-305 |
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Authors | |
Added by: | [] |
Total mark: | 5 |
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