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High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (nc AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy
Type of publication: Article
Citation:
Publication status: Accepted
Journal: Review of Scientific Instruments
Volume: 7
Year: 2003
Pages: 3656-3663
DOI: 10.1063/1.1593786
Keywords:
Authors Oral, A.
Grimble, R.A.
Ozer, H.O.
Pethica, J.B.
Added by: []
Total mark: 5
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