High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (nc AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy
Type of publication: | Article |
Citation: | |
Publication status: | Accepted |
Journal: | Review of Scientific Instruments |
Volume: | 7 |
Year: | 2003 |
Pages: | 3656-3663 |
DOI: | 10.1063/1.1593786 |
Keywords: | |
Authors | |
Added by: | [] |
Total mark: | 5 |
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