The Profile of temperature and voltage dependent series resistance and the interface states in (Ni/Au)/Al0.3Ga0.7N/AlN/GaN heterostructures
Type of publication: | Article |
Citation: | |
Publication status: | Accepted |
Journal: | Microelectronic Engineering |
Volume: | 85 |
Year: | 2008 |
Pages: | 2316-2321 |
Keywords: | |
Authors | |
Added by: | [] |
Total mark: | 5 |
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