Structural analysis of an InGaN/GaN based light emitting diode by X-ray diffraction
Type of publication: | Article |
Citation: | |
Publication status: | Accepted |
Journal: | J of Mater Sci: Mater Electron |
Volume: | 21 |
Year: | 2010 |
Pages: | 185-191 |
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Authors | |
Added by: | [] |
Total mark: | 5 |
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