Spectroscopic Ellipsometric Study of Ge Nanocrystals Embedded in SiO2 Using Parametric Models
| Type of publication: | Article |
| Citation: | |
| Publication status: | Accepted |
| Journal: | Physica Status Solidi A |
| Volume: | 5 |
| Year: | 2009 |
| Pages: | 1332-1336 |
| Keywords: | |
| Authors | |
| Added by: | [] |
| Total mark: | 5 |
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