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First name(s): |
M. |
Last name(s): |
Schilling |
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Fardmanesh, M., Schubert, J., Akram, R., Bick, M., Zhang, Y, Banzet, M., Zander, W., Krause, H.J., Burkhart, H. and Schilling, M., 1/f Noise Characteristics of SEJ Y-Ba-Cu-O rf-SQUIDs on LaA1O3 Substrate and the Step Structure, Film, and Temperature Dependence (2001), in: IEEE Trans on Applied Superconductivity, 11(1363-1367)
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[DOI]
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Fardmanesh, M., Shubert, J., Akram, R., Banzet, M., Zander, W., Zhang, Y., Schilling, M. and Krause, H.J., Dependence of the substrate structure and the film growth at the junction of YBCO SEJ rf-SQUID on the IBE process and effects on the SQUID's characteristics (2003), in: Physica C, 372(240-244)
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