Akram, R. - A Web Based Annotated Bibliography - Aigaion 2.0

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First name(s):	R.
Last name(s):	Akram

Fardmanesh, M., Schubert, J., Akram, R., Bick, M., Zhang, Y, Banzet, M., Zander, W., Krause, H.J., Burkhart, H. and Schilling, M., 1/f Noise Characteristics of SEJ Y-Ba-Cu-O rf-SQUIDs on LaA1O3 Substrate and the Step Structure, Film, and Temperature Dependence (2001), in: IEEE Trans on Applied Superconductivity, 11(1363-1367)

[DOI]

Fardmanesh, M., Shubert, J., Akram, R., Bick, M., Banzet, M., Zander, W., Zhang, Y. and Krause, H.J., Noise, Junction Characteristics, and Magnetic Field Dependencies of Bicrystal Grain Boundary Junction rf-SQUIDs (2003), in: IEEE Trans on Applied Superconductivity, 13(873-876)

Fardmanesh, M., Schubert, J., Akram, R., Bozbey, A., Bick, M., Banzet, M., Lomparski, D., Zander, W., Zhang, Y. and Krause, H.J., Junction characteristics and magnetic field dependence of low noise step edge junction rf-SQUIDs for Unshielded Applications (2003), in: IEEE Trans on Applied Superconductivity, 13(833-836)

[DOI]

Fardmanesh, M., Shubert, J., Akram, R., Banzet, M., Zander, W., Zhang, Y., Schilling, M. and Krause, H.J., Dependence of the substrate structure and the film growth at the junction of YBCO SEJ rf-SQUID on the IBE process and effects on the SQUID's characteristics (2003), in: Physica C, 372(240-244)

Akram, R., Fardmanesh, M., Schubert, J., Zander, W., Banzet, M., Lomparski, D., Schmidt, M. and Krause, H.J., Signal enhancement techniques for rf SQUID based magnetic imaging systems (2008), in: Superconductor Science & Technology, 19(821-824)

Schmidt, M., Krause, H.J., Banzet, M., Lomparski, D., Schubert, J., Zander, W., Zhang, Y., Akram, R. and Fardmanesh, M., The set-up of a high temperature superconductor radio-frequency SQUID microscope for magnetic nanoparticle detection (2008), in: Superconductor Science & Technology, 19(261-265)

Fardmanesh, M., Schubert, J., Akram, R., Bick, M., Banzet, M., Zander, W., Zhang, Y. and Krause, H.J., Analysis of electrical characteristics and magnetic field dependences of YBCO step edge and bicrystal grain boundary junctions for rf-SQUID applications (2005), in: Superconductor Science & Technology, 17(375-380)

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