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Raman and TEM Studies of Ge Nanocrystal Formation in SiOx:Ge/SiOx Multilayers
Type of publication: Article
Citation:
Publication status: Accepted
Journal: Physica Status Solidi C
Year: 9999
Keywords:
Authors Dana, A.
Agan, S.
Tokay, S.
Aydinli, A.
Finstad, T.G.
Added by: []
Total mark: 5
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