Time-Resolved XPS Analysis of the SiO2/Si System in the Millisecond Range
Type of publication: | Article |
Citation: | |
Publication status: | Accepted |
Journal: | J of Physical Chemistry B |
Volume: | 108 |
Year: | 2004 |
Pages: | 5179-5181 |
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Authors | |
Added by: | [] |
Total mark: | 5 |
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