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Self-Consistent scattering analysis of Al0.2Ga0.8N/AlN/GaN/AlN heterostructures grown on 6H-SiC substrates usding photo-Hall effect measurements
| Type of publication: | Article |
| Citation: | |
| Publication status: | Accepted |
| Journal: | J of Physics Condensed Matter |
| Volume: | 20 |
| Year: | 2008 |
| Pages: | 045208-1--5 |
| Keywords: | |
| Authors | |
| Added by: | [] |
| Total mark: | 5 |
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