Publications of Ataman, O.Y
2000
XPS characterization of Bi and Mn collected on atom-trapping silica for AAS (2000), in: Applied Spectroscopy, 53(479-482) | , and ,
XPS characterization of Bi and Mn collected on atom-trapping silica for AAS (2000), in: Applied Spectroscopy, 53(479-482) | , and ,