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Z. |
| Last name(s): |
Tekeli |
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| Corekci, S., Tekeli, Z., Cakmak, M., Ozcelik, S., Dinc, Y., Zeybek, O. and Ozbay, E., Effects of thermal annealing on the morphology of the AlxGa(1-x)N films (2011), in: Materials Science in Semiconductor Processing, 12(238-242)
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| Corekci, S., Tekeli, Z., Cakmak, M., Ozcelik, S., Dinc, Y., Zeybek, O. and Ozbay, E., Effects of thermal annealing on the morphology of the AlxGa(1-x)N films (2011), in: Materials Science in Semiconductor Processing, 12(238-242)
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| Corekci, S., Usanmaz, D., Tekeli, Z., Cakmak, M., Ozcelik, S. and Ozbay, E., Surface morphology of AlO.3Ga0.7N/Al203-High Electron Mobility Transistor structure (2009), in: J of Nanoscience and Nanotechnology, 8(640-644)
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| Corekci, S., Usanmaz, D., Tekeli, Z., Cakmak, M., Ozcelik, S. and Ozbay, E., Surface morphology of AlO.3Ga0.7N/Al203-High Electron Mobility Transistor structure (2009), in: J of Nanoscience and Nanotechnology, 8(640-644)
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| Tekeli, Z., Altindal, S., Cakmak, M., Ozcelik, S., Caliskan, D. and Ozbay, E., The behavior of the I-V-T characteristics of inhomogeneous (Ni/Au)-Al0.3Ga0.7N/AIN/GaN heterostructures at high temperatures (2007), in: J Applied Physics, 102(054510-1--8)
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[DOI]
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| Tekeli, Z., Altindal, S., Cakmak, M., Ozcelik, S., Caliskan, D. and Ozbay, E., The behavior of the I-V-T characteristics of inhomogeneous (Ni/Au)-Al0.3Ga0.7N/AIN/GaN heterostructures at high temperatures (2007), in: J Applied Physics, 102(054510-1--8)
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[DOI]
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| Tekeli, Z., Altindal, S., Cakmak, M., Ozcelik, S. and Ozbay, E., The Profile of temperature and voltage dependent series resistance and the interface states in (Ni/Au)/Al0.3Ga0.7N/AlN/GaN heterostructures (2009), in: Microelectronic Engineering, 85(2316-2321)
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| Tekeli, Z., Altindal, S., Cakmak, M., Ozcelik, S. and Ozbay, E., The Profile of temperature and voltage dependent series resistance and the interface states in (Ni/Au)/Al0.3Ga0.7N/AlN/GaN heterostructures (2009), in: Microelectronic Engineering, 85(2316-2321)
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