TEM studies of Ge nanocrystal formation in PECVD grown SiO2:Ge/SiO2 Multilayers
| Type of publication: | Article |
| Citation: | |
| Publication status: | Accepted |
| Journal: | J of Physics Condensed Matter |
| Volume: | 18 |
| Year: | 2006 |
| Pages: | 5037-5045 |
| Keywords: | |
| Authors | |
| Added by: | [] |
| Total mark: | 5 |
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