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Suzer, S.
First name(s): S.
Last name(s): Suzer

Publications of Suzer, S. sorted by recency
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Suzer, S., Abelev, E. and Bernasek, S.L., Impedance-type measurements using XPS (2010), in: Applied Surface Science, 256(1296-1298)
Suzer, S. and Dana, A., X-ray Photoemission for Probing Charging/Discharging Dynamics (2007), in: J of Physical Chemistry B, 110(19112-19115)
Suzer, S. and Dana, A., X-ray Photoemission for Probing Charging/Discharging Dynamics (2007), in: J of Physical Chemistry B, 110(19112-19115)
Karabudak, E., Demirok, U.K. and Suzer, S., XPS Analysis with Pulsed Voltage Stimuli (2006), in: Surface Science, 600(12-14)
Ertas, G., Demirok, U.K. and Suzer, S., Enhanced Peak Separation in XPS with External Biasing (2005), in: Applied Surface Science, 249(12-15)
Karadas, F., Ertas, G. and Suzer, S., Differential charging in SiO2/Si system as determined by XPS (2004), in: J of Physical Chemistry B, 108(1515-1518)
Ulgut, B. and Suzer, S., XPS Studies of SiO2/Si System under External Bias (2004), in: J of Physical Chemistry B, 107(2939-2943)
Owens, T.M., Nicholson, K.T., Banaszak Holl, M.M and Suzer, S., Formation of Alkylsilane Based Monolayers on Gold (2003), in: J of American Chemical Society, 124(6800-6801)
Sayan, S., Garfunkel, E. and Suzer, S., Soft X-ray Photoemission Studies of the HfO2/SiO2/Si System (2002), in: Applied Physics Letters, 80(2135-2137)
[DOI]
Suzer, S., Deposition and Stability of Metal Ions on Oxidized Silicon Surfaces: Electrochemical Correlation (2002), in: J of Electron Spectroscopy and Related Phenomena, 114(1151-1154)
Suzer, S., XPS Investigation of X-Ray-Induced Reduction of Metal Ions (2002), in: Applied Spectroscopy, 54(1716-1718)
Suzer, S. and Dag, O., Reductive deposition of Au3+(aq) on oxidized silicon surfaces (2001), in: Canadian Jrl of Chemistry, 78(516-519)
Suzer, S. and Dag, O., Reductive deposition of Au3+(aq) on oxidized silicon surfaces (2001), in: Canadian Jrl of Chemistry, 78(516-519)
First Page | 1-50 | 51-100 | 101-112 | Last Page