Dear guest, welcome to this publication database. As an anonymous user, you will probably not have edit rights. Also, the collapse status of the topic tree will not be persistent. If you like to have these and other options enabled, you might ask Admin for a login account.
| This site is powered by Aigaion - A PHP/Web based management system for shared and annotated bibliographies. For more information visit www.aigaion.nl. |
|
Publications of Demirok, U.K. sorted by journal and type
| , , and , Electrical circuit modeling of surface structures for X-ray photoelectron spectroscopic measurements (2008), in: Surface Science, 602(365-368) |
| , , and , X-ray Photoelectron Spectroscopic Analysis of Si Nanoclusters in SiO2 Matrix (2007), in: J of Physical Chemistry B, 110(1137-1140) |
| , , , and , Charging/Discharging of Au(core)/Silica(shell) nanoparticles as Revealed by XPS (2006), in: J of Physical Chemistry B, 109(24182-24184) |
| , , and , X-ray Photoelectron Spectroscopic Analysis of Si nanoclusters in SiO2 Matrix (2006), in: J of Physical Chemistry B, 110(1137-1140) |
| , , and , X-ray photoelectron spectroscopy for resistance-capacitance measurements of surface structures (2006), in: Applied Physics Letters, 86(183110-1--3) |
| , and , XPS Analysis with Pulsed Voltage Stimuli (2006), in: Surface Science, 600(12-14) |
| , and , Enhanced Peak Separation in XPS with External Biasing (2005), in: Applied Surface Science, 249(12-15) |
| , and , Time-Resolved XPS Analysis of the SiO2/Si System in the Millisecond Range (2005), in: J of Physical Chemistry B, 108(5179-5181) |
Applied Physics Letters
| , , and , X-ray photoelectron spectroscopy for resistance-capacitance measurements of surface structures (2005), in: Applied Physics Letters, 86(1831010-1--3) |
[DOI] |