Suzer, S.
First name(s): S.
Last name(s): Suzer

Publications of Suzer, S.
First Page | 1-50 | 51-100 | 101-112 | Last Page

2011
2010
Suzer, S., Abelev, E. and Bernasek, S.L., Impedance-type measurements using XPS (2010), in: Applied Surface Science, 256(1296-1298)
Sezen, H., Ertas, G. and Suzer, S., Methods for probing charging properties of polymeric materials using XPS (2010), in: J of Electron Spectroscopy and Related Phenomena, 178(373-379)
Sezen, H., Ertas, G. and Suzer, S., Methods for probing charging properties of polymeric materials using XPS (2010), in: J of Electron Spectroscopy and Related Phenomena, 178(373-379)
Suzer, S., Sezen, H., Ertas, G. and Dana, A., XPS measurements for probing dynamics of charging (2010), in: J of Electron Spectroscopy and Related Phenomena, 176(52-57)
Suzer, S., Sezen, H., Ertas, G. and Dana, A., XPS measurements for probing dynamics of charging (2010), in: J of Electron Spectroscopy and Related Phenomena, 176(52-57)
2009
2008
Ozkaraoglu, E., Tunc, I. and Suzer, S., X-ray induced reduction of Au and Pt ions on silicon substrates (2008), in: Surface Coatings and Technology, 201(8202-8204)
2007
Suzer, S. and Dana, A., X-ray Photoemission for Probing Charging/Discharging Dynamics (2007), in: J of Physical Chemistry B, 110(19112-19115)
Suzer, S. and Dana, A., X-ray Photoemission for Probing Charging/Discharging Dynamics (2007), in: J of Physical Chemistry B, 110(19112-19115)
2006
Karabudak, E., Demirok, U.K. and Suzer, S., XPS Analysis with Pulsed Voltage Stimuli (2006), in: Surface Science, 600(12-14)
2005
Ertas, G., Demirok, U.K. and Suzer, S., Enhanced Peak Separation in XPS with External Biasing (2005), in: Applied Surface Science, 249(12-15)
2004
Karadas, F., Ertas, G. and Suzer, S., Differential charging in SiO2/Si system as determined by XPS (2004), in: J of Physical Chemistry B, 108(1515-1518)
Ulgut, B. and Suzer, S., XPS Studies of SiO2/Si System under External Bias (2004), in: J of Physical Chemistry B, 107(2939-2943)
First Page | 1-50 | 51-100 | 101-112 | Last Page